Developed with experienced electron microscopists, our EM products are designed for reliability and ease of use. Each product is made to order and can be fitted by our team of expert microscopy engineers.
Our probe current meter has been designed with electron beam lithography, ion beam and EDX users in mind. Battery operated, it can measure down to 1pA with no interferece with surrounding instruments.
Chamber View is an infrared remote viewing system with many applications, from electron microscopes specimen chambers to experimental observations.
We make both electromagnetic and electrostatic beam blankers for electron microscope columns.